Product Catalog: |

# Hall Effect Measurement System

- DX-50 Hall Effect Measurement System
- DX-100 Hall Effect Measurement System
- DX-3000 Hall Effect Measurement System

Product Detail: |

# DX-50 Hall Effect Measurement System

**Testable materials:**

- Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials etc.
- Low impedance material: metal, transparent oxide, weak magnetic semiconductor materials, TMR material, ect.
- High impedance material: Semi-insulating GaAs, GaN, CdTe, etc.

**Hall-effect system components: **

This system is consisted of electromagnet, high-precision electromagnet power supply, high-precision constant current source, high-precision voltage meter, gauss meter, connecting cables, standard sample, sample mount and the system software. The system contains specially developed DX-320 constant current source, six semi-microvolt meter and complex switching relays for Hall measurements (Integrally assembled switch). These have greatly simplified the connection and operation of experimental. DX-320 can be used alone as a constant current source or micro-volt meter. The system can be used to measure the carrier concentration, mobility, resistivity, Hall coefficient, and other important parameters of semiconductor material. These parameters must be known in advance to understand the electrical properties of semiconductor materials, so Hall Effect measurement system is an essential tool to understand and study of semiconductor devices and electrical properties of semiconductor materials. The results can be calculated by the software automatically, at the same time, it will get Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magneto resistance, I-V curve and I-R curve measurement parameters.

No. |
Item |
Model |
Descriptions |

1 | Electromagnet | DXWD-50 | Magnetic field: 7000 Gauss at 20mm air gap |

2 | High precision Gauss meter |
DX-160 | Accuracy: ± 0.30% of reading/Resolution: 0.01mT Range :0-3T /probe Thickness: 1.0mm/Length 100mm /digital Rs-232 interface data reading software with CDX-800F probe |

3 | High precision Power supply |
F2031 | Digital constant current power supply 10A, 100V, 1000W, RS-232 interface can be CNC polar conversion, resolution: 1mA |

4 | Probe and sample holder |
Non-magnetic aluminum bracket 5-70mm adjustable; sample holder fixture (on request) | |

5 | System software | Adjusting the magnetic field can be digitized and current testing of various material parameters | |

6 | Constant current source and electric meter |
DX-320 | Current output: 0.1nA-50mA, voltage test: 0.1uV-30V |

7 | Calibration Sample | Silicon Sheet/Ga/As, resistance: 300~500Ω |

**Main technical indicators:**

1) Magnetic field intensity: Greater than 7000 gauss (DX-50)

Greater than 14000 gauss (DX-100) Magnetic gap 15mm

2) Electric current: 0.1mA~50mA（Expandable to 1A）

3) Measuring voltage: 0.1uV~30V

4) Offers a variety of standard test materials: GaAs, Si etc.

5) Magnetic field minimum resolution: 0.01mT

6) Magnetic field measuring range: 0~3T

7) Resistance Range: 10mΩ~1MΩ

8) Carrier concentration: 10^{3}~10^{22}cm^{-3}

9) Mobility: 10^{3}~10^{5}cm^{2}/Vs

10) Systematic measurement errors: <2%

▲ with Gauss meter or data acquisition board computer communications

▲ I-V curves and I-R curve measurements

▲ resistivity range :10^{-6} ~ 10^{11} Ohm * cm

▲ Resistance Range: 10 m Ohms ~ 1MOhms

▲ carrier concentration: 10^{3} ~ 10^{22}scm^{-3}

▲ mobility: 10^{2} ~ 10^{7} cm^{2}/volt * sec

▲ fully automated testing, a key processing