Product Catalog: 
Hall Effect Measurement System
 DX50 Hall Effect Measurement System
 DX100 Hall Effect Measurement System
 DX3000 Hall Effect Measurement System
Product Detail: 
DX3000 Series Hall Effect Measurement System
Introduction
The electrical transport test system is one fully automated test system, which intergrates Hall effect, magnetoresistance, IV characteristics test in one machine. This system takes some problems which users often ignore, such as instrument configuration, circuit wiring (including room temperature and lowtemperature wiring) into consideration, selects the Keithley electrical measuring instruments. The magnetic field can adopt electromagnet or liquid helium superconducting magnet based on user’s requirement, equipped the smart measurement sample rod, plus a special fully automated test software, allowing users to quickly and easily measure sample and obtain accurate and reliable data. Addition, there are a variety of lowtemperature options, and can transform according to the user's existing instrumentation and the special requirements of the software. DX3000 series hall effect measurement system is a powerful tool for the resaearch of materials’ electrical transport properties.
Basic configuration:
U.S. Keithley instrumentation
System (resistance range) 
Source meter 
Voltmeter 
Ammeter 
Host computer 
Matrix card 
Electrometer 
Commu nication Interface 

2400 
6220 
2700 
2182A 
6485 
7001 
7709 
7012 
7152 
6514 
488B 

Standard (10mΩ10MΩ) 
1 
1 
1 
1 

High sensitivity (0.1mΩ10MΩ) 
1 
1 
1 
1 
1 

High voltage and impedance (0.1mΩ100GΩ) 
1 
1 
1 
1 
2 
2 
1 
Magnetic part
Magnetic field range 
Magnetic body 
Cooling device 
Magnetic field measurement 
Power 
Software 
0~1T@10mm 
DX100 electromagnet 
Without 
DX160 gauss meter Precision: 0.2% 
DX2030, 1KW 
Full automatic data processing and drawing 
0~2.4T@10mm 
DX130 electromagnet 
Without 
DX180 gauss meter Precision: 0.05% 
DX10030, 3KW 
Full automatic data processing and drawing 
0~2.6T@10mm 
DX180 electromagnet 
8KW water chiller 
DX180 gauss meter Precision: 0.05% 
DX10050, 5KW 
Full automatic data processing and drawing 
Low temperature portion (optional)
Temperature Range 
Cooling body 
Temperature control device 
80~450K 
Liquid nitrogen thermostat 
TC202 
4~500K 
Cycle refrigerator 
TC202 
4~325K 
Cryogenic low temperature system 
TC202 
45~325K 
CTI small refrigerator 
TC202 
Main features:
 Using plugsample cards, easy to install;
 One standard configuration can simultaneously measure two samples, 4 samples can be measured simultaneously by adding optional devices;
 Resistance measurement range: 0.1mΩ～100GΩ(High voltage and impedance system);
 Different Hall effect and resistance measurements under different current and magnetic field;
 Testing and calculation process performed automatically by the software, which gives the intermediate data and the curve at the same time.It will save you a lot of time;
 System provides high stability of the magnetic field for a long time,zero magnetic field can be smoothed;
 Electromagnet power supplybuilt in precision Gauss Meter, high field control speed;
 Choosing lowtemperature device,Hall effect and resistance measurements can be performed at different temperatures.
Testable material:
 Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and Ferrite materials, etc.
 Low impedance material: metal, transparent oxide, weak magnetic semiconductor materials, TMR materials, etc.
 High impedance material: semiinsulating GaAs, GaN, CdTe,etc.
Basic function:
 Measurement of Hall Effect, magnetic resistance, curves of IV and RT .
 Parameters to be measured: Hall Effect sheet resistance, resistivity, Hall coefficient, conductivity type, Hall mobility, carrier concentration;
 Magnetic resistance effect: R, △R, (△R/R)%, (△R/R0)%
 IV curve: IV curves at different temperature and magnetic field.
 RT curve: Under fixed magnetic field, the curves for resistance changes at different temperature.
 RH curve: Under fixed temperature, the curves for resistance changes at different magnetic field.
Main technical indexes:
 Sample size
 Small size sample card: 12*12 mm2
 Large size sample card: 50*50 mm2
 Probe sample card: 1×1mm2～30×30mm2
 Sample measurement method
 Hall effect samples: Si, GaAs, ect.
 Resistance and IV samples: 4 wire or 6 wire method
 Magnetic field environment
Model Index 
DX100 
DX130 
DX180 

Pole diameter 
60mm(optional) 
100mm(optional) 
120mm(optional) 

Air gap 
Room temp. 10mm 
Liquid nitrogen thermostat 24mm optional 
ARS refrigerator 40mm optional 
Room temp. 10mm 
Liquid nitrogen thermostat 24mm optional 
ARS refrigerator 40mm optional 
Room temp. 10mm 
Liquid nitrogen thermostat 24mm optional 
ARS refrigerator 40mm optional 
Max. magnetic field 
1.5T 
0.9T 
0.6T 
2.5T 
1.5T 
1.0T 
2.7T 
2.0T 
1.4T 
Uniformity 
±1% 
±1% 
±1% 
 Temperature environment (optional)
 No liquid helium superconducting magnet system, 1.6K～325K;
 Liquid nitrogen thermostat options:
Standard liquid nitrogen thermostat, 80K～325K;
High temperature liquid nitregen thermostat, 80K～500K;  Cycle refrigerator options:
Standard 4K refrigerator system, 4K～325K;
High temperature 4K refrigerator, 4K～700K;
Standard 10K refrigerator system, 10K～325K;
High temperature 10K refrigerator, 10K～800K;
Minisize refrigerator system, 45K～325K;
 Electrical properties
Under the following typical test conditions:
 Sample power consumption less than 1mV, under this condition, let excitation reach the maximum recommended current and voltage in system configuration;
 Sample temperature 295K;
 Sample seat without leak current;
 The reistance of each test lead 25Ω;
 Voltage usage effectiveness of measurement electrical resistivity (V_out/V_in) should be 0.1 approx. for Vanderbit sample and should be 0.5 approx. for hall sample;
 Sample shape correction factor 1;
 Magnetic field and sample thickness measurement uncertainty should be within 1%;
 Magnetic field/sample thickness should be 1T/mm, note the measured maximum carrier concentration is approximately proportional to this value, so stronger magnetic field and thicker sample could improve the measurement range.
System 
Standard 
Current source 
±100pA～±0.1A 
Voltage source 
±0.1uV～±30V 
Current 
±100pA～±100mA (min. resolution 100pA) 
Voltage 
±0.1uV～±30V (min. resolution 0.1uV) 
Max. resistance 
10MΩ 
Min. resistance (VDP) 
40mΩ 
Min. resistance(HB) 
10mΩ 
Max. carrier concentration 
1.0E+18 